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Immittance Spectroscopy

Applications to Material Systems
By Mohammad Alim
Copyright: 2017   |   Expected Pub Date:December 31, 2017//
ISBN: 9781119184850  |  Hardcover  |  
424 pages
Price: $195 USD
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One Line Description
Written by one of the pioneers of Immittance Spectroscopy, the book covers precise definition, theory, and applications of overall immittance spectroscopy reflecting the meaning and scope of the spectroscopic style analysis of the data.

This book is designed for scientists and engineers, graduate and post-graduate students in the disciplines of solid state physics, chemistry, electrochemistry, biology and biological sciences, bioengineering and biotechnology, materials science and engineering, electrical engineering, mechanical engineering, civil engineering, chemical engineering, metallurgy, corrosion science, reliability engineering, quality control.

This book emphasizes the use of four complex plane formalisms (impedance, admittance, complex capacitance, and modulus) in a simultaneous fashion. The purpose of employing these complex planes for handling semicircular relaxation using a single set of measured impedance data (ac small-signal electrical data) is underscored. The current literature demonstrates the importance of template version of impedance plot whereas this book reflects the advantage of using concurrent four complex plane plots for the same data. This approach allows extraction of a meaningful equivalent circuit model attributing to possible interpretations via potential polarizations and operative mechanisms for the investigated material system. Thus, this book supersedes the limitations of the impedance plot, and intends to serve a broader community of scientific and technical professionals better for their solid and liquid systems.
This unique book addresses the following:
• Lumped Parameter/Complex Plane Analysis (LP/CPA) in conjunction with the Bode plots
• Equivalent circuit model (ECM) derived from the LP/CPA
• Underlying Operative Mechanisms along with the possible interpretations
• Ideal (Debye) and non-ideal (non-Debye) relaxations
• Data-Handling Criteria (DHC) using Complex Nonlinear Least Squares (CNLS) fitting procedures.

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Author / Editor Details
Mohammad A. Alim is a Professor in the Department of Electrical Engineering & Computer Science at Alabama A & M University (AAMU) where he joined as one of the founding faculty members in August 1998. He earned MS in Physics and PhD in Electrical Engineering & Computer Science from Marquette University in 1980 and 1986, respectively. He is the singlehanded pioneering developer of the concurrent multiple complex plane analysis of the measured ac small-signal electrical data. The achievement of the frequency-independent dielectric behavior for the polycrystalline varistors was a milestone and has been highly cited for a variety of complicated material systems. Most recently Dr. Alim has been instrumental in developing collaboratively MATLAB based CNLS curve fitting. His long time exposure in experiments with the state-of-the-art instruments and knowledge in supervision and maintenance is the asset for the semiconductor measurements and reverse engineering curricula. He possesses 100+ publications comprising of co-edited books, book chapters, NASA Technical Memorandum, peer-reviewed journal papers, U.S. patents, and conference proceedings/abstracts, etc. beside international seminars.

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